X-Ray diffraction multi-techniques (XRD)



We have the latest diffraction equipment to perform several types of diffraction and reflectometry experiments. These studies allow for the identification of crystal structure, alloy composition, relative orientation of different stacked structures, in a non-destructive way, just as much on thin films and nanometric objects like wires or quantum boxes.


« Smartlab » RIGAKU Rotating anode diffractometer multi-settings

Powders diffraction, texture, reflectometry, high resolution diffraction and inplane diffraction.


  • X ray rotating anode 9 kW
  • focusing X-ray optics
  • Ge(220)x2, Ge(400)x2, Ge(220)x4 monochromator optics and Ge(220)x2 « triple axis » back monochromator
  • CBO-f polycapillaries lens
  • 0,15°, 0,5° and 5° collimating optics
  • 0,114°, 0,5° and 5° back collimating optics
  • scintillator detector
  • HyPix-3000 high energy resolution 2D detector
  • DHS1100 AntonPaar heating chamber

« XPert Pro MRD » PANalytical
2 sealed tube multi-settings diffractometers


  • copper X-Ray Tube
  • focused mirror
  • Ge(220)x4 monochromator and « triple axis » Ge(220)x2 back monochromator
  • polycapillaries lens
  • 0.18° back collimators
  • He detector
  • 1D Pixcel detector

Illustrations :


GaN (10-10) pole figure to determine crystallographic orientation relationship of epitaxied GaN nanofils on Si (001) susbtrat – C2N studies.

Reciprocal space map about (004) and (115) of GaMnAs/InGaAs/GaAs structure to quantify stress and components. GaMnAs layer is strained by  InGaAs layer which is relaxed on GaAs substrat. Perpendicular of surface, a magnetic phenomenon is due by the deformation of GaAs layer